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A Software-based self-test methodology for system peripherals

M. Grosso, W.J. Perez H., D. Ravotto, E. Sanchez, M. Sonza Reorda, J. Velasco Medina

15th IEEE European Test Symposium (ETS), 2010, pp. 195-200

Functional Test Generation for DMA Controllers

Grosso M; W.J. Perez H; Ravotto D; Sanchez E.; Sonza Reorda M; Velasco Medina J

11th IEEE Latin-American Test Workshop 2010, 2010

On the Generation of Functional Test Programs for the Cache Replacement Logic

W.J. Perez H; Ravotto D.; E. Sanchez; M. Sonza Reorda; A. Tonda

Asian Test Symposium, ATS'09, 2009, pp. 418-423

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Enlaces externos 

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Visitas

Grupo de Investigación en Robótica y  Automatización Industrial

Calle 4a sur - No. 15-134

Sogamoso- Boyaca
 

T: 310-7637794​

gira.uptc@gmail.com

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